Atomic Force Microscopes (AFM)
Atomic force microscopy delivers three-dimensional surface imaging and property measurement at the nanoscale. Park Systems' research AFM lineup spans compact small-sample systems to fully automated 300 mm wafer platforms, plus high-vacuum, bio-electrochemical, and nano-IR variants.
Overview
Park Systems – the world-leading AFM manufacturer – builds every research AFM around the same core technologies: a flexure-guided orthogonal scan system that eliminates crosstalk between axes, True Non-Contact™ mode that preserves both tip and sample, and the AI-powered SmartScan operating software. The small-sample family covers the automated FX40, the workhorse NX10, the compact NX7, and the atomic-resolution NX1. Large-sample platforms scale from the NX15 (150 mm) through the NX20 and FX200 (200 mm) to the FX300 and NX20 300 mm for full wafers. Specialized systems add the NX12 for biological and electrochemical research and the NX-Hivac for high-vacuum failure analysis, while the FX40 IR, FX200 IR, and FX300 IR integrate nanoscale infrared spectroscopy (PiFM) for chemical imaging with sub-5 nm resolution.
Manufacturer: Park Systems — South Korea
Local sales, installation, and technical support in Bangladesh by trained local engineers.
Models
Small Sample AFM: Park FX40
The most advanced AFM for small samples, with AI-driven automation of probe exchange, laser alignment, and scanning.
Small Sample AFM with Nano-IR: Park FX40 IR
The non-contact AFM for small-sample chemical imaging, combining the FX40 with nanoscale IR spectroscopy (PiFM).
Small Sample AFM: Park NX10
Park Systems' original small-sample AFM – proven performance in nanoscale metrology for research laboratories worldwide.
Small Sample AFM: Park NX7
Accessible nanometrology for academic research in a compact, table-top format.
High-Resolution AFM: Park NX1
The highest resolution AFM – atomic-scale imaging in ambient conditions with a noise floor an order of magnitude lower than typical systems.
Large Sample AFM: Park FX200
The most advanced AFM for 200 mm samples, with automated probe exchange, autofocus, and a full-wafer sample-view camera.
Large Sample AFM with Nano-IR: Park FX200 IR
IR spectroscopy meets advanced 200 mm AFM – nanoscale chemical imaging on the proven FX200 platform.
Large Sample AFM: Park FX300
The most advanced AFM for 300 mm samples, with industrial safety features and fully automated workflows.
Large Sample AFM with Nano-IR: Park FX300 IR
IR spectroscopy meets advanced 300 mm AFM – nanoscale chemical imaging on the proven FX300 platform.
Large Sample AFM: Park NX20
The leading nanometrology tool for failure analysis and large-sample research, up to 200 mm.
Large Sample AFM: Park NX20 300 mm
The leading nanometrology tool bridging research and industry, with full coverage of 300 mm wafers.
Large Sample AFM: Park NX15
The versatile nanometrology tool for advanced research, covering wafers up to 150 mm.
Specialized AFM: Park NX12
The ideal choice for biological and electrochemical studies – AFM integrated with inverted optical microscopy and nanopipette techniques.
High-Vacuum AFM: Park NX-Hivac
The ideal choice for failure analysis and air-sensitive materials research, operating at 10⁻⁵ Torr.
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