Specialized AFM: Park NX12

Overview

Park NX12 is a specialized atomic force microscope for materials science, electrochemical, and biochemical research. It delivers nanoscale imaging and property characterization in both liquid and ambient environments, integrating scanning probe techniques with inverted optical microscopy for comprehensive analysis of dynamic processes. A digitally controlled environmental chamber maintains stable gas and temperature conditions for reliable, reproducible research.

Integration with Inverted Optical Microscopy

NX12 provides seamless integration with inverted optical microscopy, combining the large field of view of optical imaging with the nanoscale resolution of AFM. This correlative setup analyzes samples across multiple length scales in a single workflow – particularly valuable for transparent samples and biological research, where cellular-level structures and nanoscale details must be studied together.

Nanopipette-Based Scanning Probe Microscopy

Beyond conventional AFM imaging, NX12 supports SICM, which measures the surface topography of soft, liquid-immersed, or biological samples by monitoring ionic current through a nanopipette; SICM-SECM, which simultaneously maps topography and local electrochemical activity in liquid; and SECCM, which analyzes localized electrochemical reactions through a nanopipette meniscus without immersing the entire sample.

Fast Z Servo and High Resolution

The NX Z scanner, built with a stacked piezo actuator and a strain gauge sensor, delivers fast and precise measurements across a wide range of surfaces, maintaining consistent roughness linearity regardless of scan size. It maintains straightness within 0.1% across the usable range, with out-of-axis motion under 5 nm even at a full 15 µm extension, for reliable, distortion-free nanoscale measurements.

Orthogonal Scan System and True Non-Contact™ Mode

Conventional AFMs with tube scanners suffer from out-of-plane motion and axes crosstalk, resulting in image distortion, especially over large scan areas. Like all Park AFMs, this system employs an advanced orthogonal scan system with a flexure-guided architecture: a 2D flexure scanner moves the sample in the XY plane, while a separate 1D flexure scanner independently controls the probe's Z-axis motion. This separated scanner design ensures highly orthogonal, linear scans with minimal out-of-plane motion, and closed-loop servo control with low-noise sensors delivers precise, repeatable scanning across all axes.

True Non-Contact™ mode is a proprietary technology exclusively offered by Park Systems. It obtains topography by detecting the attractive van der Waals force between the AFM tip and the sample surface, preventing destructive tip-sample interaction during the scan. The result is high-resolution, accurate data with prolonged tip life and preserved sample integrity – even on the most delicate or fragile samples.

Software

Park SmartScan™ is an advanced AFM operating software featuring an elegant, intuitive interface and powerful features designed for superior image quality and an enhanced user experience. Park SmartAnalysis™ complements it with fast image processing, comprehensive data analysis, and efficient result publication.

Specifications for Park NX12