Product Category

Surface & Nanoscale Analysis

Image and analyze surfaces at the micro and nanoscale. Atomic force microscopes, X-ray photoelectron (XPS) and Auger spectrometers, secondary ion mass spectrometry (SIMS), and atom probe tomography reveal topography, elemental identity, chemical state, and three-dimensional composition for materials, semiconductor, and failure analysis.

Brands: Park Systems, JEOL, CAMECA

INSTRUMENTS & EQUIPMENT

Atomic Force Microscopes (AFM)
Park Systems atomic force microscopes for nanoscale imaging, metrology, and analysis.
X-ray Photoelectron Spectroscopy (XPS)
XPS is a superior technique for analyzing surface areas as well as analyzing chemical bonding state with high energy resolution. The technique can be used for profiling the elemental composition across the surface and also for depth profiling when paired with ion-beam etching.
Auger Microprobe
Surface-sensitive elemental analysis with high spatial resolution.
Secondary Ion Mass Spectrometry (SIMS)
Ultra-sensitive surface and depth-profile analysis.
Atom Probe Tomography (APT)
3D atomic-scale compositional mapping of materials.
Ellipsometers
Imaging and spectroscopic ellipsometers for thin-film thickness and optical constants.