X-ray Photoelectron Spectroscopy (XPS)
X-ray photoelectron spectroscopy identifies the elements present in the top few nanometers of a surface and, crucially, their chemical states. JEOL XPS systems support materials development, failure analysis, and surface engineering.
Overview
XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.
The technique can be used for profiling the elemental composition across the surface and also for depth profiling when paired with ion-beam etching.
Manufacturer: JEOL — Japan
Authorized distributor in Bangladesh. Factory-trained engineers available for local support.
Models
XPS — Model: JPS-9030
The JPS-9030 can provide high-speed depth profiling and low damage depth profiling with quantitative and chemical bonding state analysis.
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