Small Sample AFM: Park FX40

Overview

Park FX40 is Park Systems' latest innovation in atomic force microscopy, designed for high-resolution imaging of small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability. Key features include automatic probe exchange, automatic laser beam alignment, and a sample-view camera – the signatures of FX-series AFMs that streamline operation while significantly enhancing productivity.

Superior FX Mechanical Design

The FX-series AFMs are designed for minimal mechanical noise. The optical microscope is decoupled from the Z stage, lowering the weight on the Z stage and reducing susceptibility to mechanical disturbances, while the Z stage itself is built with a high-stiffness cross-roller guide and two bearing blocks. Construction with materials of low thermal expansion coefficients mitigates thermal drift for reliable performance over time.

Automatic Laser Beam Alignment and Probe Exchange

A vision-guided alignment system detects the cantilever shape and position, aligns it at the center of the field of view, and steers the laser beam onto the position-sensitive photodetector automatically – reducing setup time and ensuring consistent alignment. The automatic tip exchanger (ATX) stores up to 8 pre-mounted probes on QR-coded chip carriers with kinematic mounting, so probes are exchanged with a simple mouse click and without risk of cantilever breakage.

Sample-View Camera and On-Axis Optics

The sample-view camera provides a captured image of the sample, allowing users to point and click to move the XY stage – convenient navigation to areas of interest and easy return to the same location. The unobstructed on-axis optical microscope provides a clear field of view and resolves line widths down to 0.87 µm.

Orthogonal Scan System and True Non-Contact™ Mode

Conventional AFMs with tube scanners suffer from out-of-plane motion and axes crosstalk, resulting in image distortion, especially over large scan areas. Like all Park AFMs, this system employs an advanced orthogonal scan system with a flexure-guided architecture: a 2D flexure scanner moves the sample in the XY plane, while a separate 1D flexure scanner independently controls the probe's Z-axis motion. This separated scanner design ensures highly orthogonal, linear scans with minimal out-of-plane motion, and closed-loop servo control with low-noise sensors delivers precise, repeatable scanning across all axes.

True Non-Contact™ mode is a proprietary technology exclusively offered by Park Systems. It obtains topography by detecting the attractive van der Waals force between the AFM tip and the sample surface, preventing destructive tip-sample interaction during the scan. The result is high-resolution, accurate data with prolonged tip life and preserved sample integrity – even on the most delicate or fragile samples.

Powerful FX Controller and Software

The FX AFM controller features an 8-channel lock-in amplifier and 5 MHz bandwidth for advanced signal processing, supporting a wide range of cutting-edge modes and options. Park SmartScan™ is an advanced AFM operating software featuring an elegant, intuitive interface and powerful features designed for superior image quality and an enhanced user experience. Park SmartAnalysis™ complements it with fast image processing, comprehensive data analysis, and efficient result publication.

Specifications for Park FX40