High-Resolution AFM: Park NX1
Park NX1 is a compact AFM designed for high-resolution imaging with stable operation. The system combines a mechanically rigid structure with a thermally stable body to support atomic-scale imaging in ambient conditions, while maintaining the ease of use typical of Park Systems instruments.
Manufacturer: Park Systems — South Korea
Overview
Park NX1 is a compact AFM designed for high-resolution imaging with stable operation. The system combines a mechanically rigid structure with a thermally stable body to support atomic-scale imaging in ambient conditions, while maintaining the ease of use typical of Park Systems instruments.
Optimized AFM Architecture
A minimal mechanical loop between probe and sample improves mechanical stability, and the AFM core body is made of Kovar to reduce thermal drift. A precision XYZ tube scanner combined with a tungsten carbide stick-slip stage and kinematic contacts enables stable positioning for consistent atomic-resolution imaging.
Low Noise Performance
The NX1 achieves a noise floor about an order of magnitude lower than typical AFM systems, enabled by its optimized architecture. This low noise level provides a stable measurement environment, supporting consistent signal detection and atomic-resolution imaging.
On-Axis Optical Microscope and Laser Alignment
A high-resolution on-axis optical microscope provides a direct view of both the probe and sample, enabling accurate tip positioning and efficient navigation, with integrated illumination for clear visibility. The beam-bounce detection system with a separated detection module preserves measurement stability and enables fast laser positioning on the cantilever.
qPlus® Sensor Option
The NX1 supports an optional qPlus sensor based on a quartz tuning fork for advanced atomic-scale measurements. Its high stiffness enables stable operation at picometer-scale amplitudes, minimizing jump-to-contact.
Software
Park SmartAnalysis™ delivers fast and comprehensive data processing, enabling efficient interpretation and clear visualization of results within a smooth, user-friendly workflow.
Specifications for Park NX1
| Specification | Park NX1 |
|---|---|
| XYZ Scanner | XY scan range 3 µm × 3 µm; Z scan range 1 µm; open-loop feedback control |
| Stage | XY 0.5 mm × 0.5 mm; Z 15 mm |
| Sample Mount | Size Ø 16 mm, up to 10 mm thickness; weight 2 g – 10 g |
| On-Axis Optics | Direct on-axis vision of sample surface and cantilever; field of view 480 µm × 360 µm (with 10× objective); 1.2 M pixel CCD (5 M pixel optional) |
| Architecture | Minimal probe-to-sample mechanical loop; Kovar core body for low thermal drift; tungsten carbide stick-slip stage with kinematic contacts |
| Noise Floor | About an order of magnitude lower than typical AFM systems |
| Imaging Mode | True Non-Contact™ mode (Park proprietary) plus standard AFM imaging and property-mapping modes |
| AFM Modes | Topographic (contact, True Non-Contact™, tapping, PinPoint™); mechanical (PinPoint™ nanomechanical, F-D spectroscopy, FMM, TFM); electrical (C-AFM with I-V spectroscopy, PFM variants, EFM, KPFM variants); magnetic (MFM variants); options marked by Park as requiring additional configuration |
| Options | qPlus® quartz tuning fork sensor for picometer-scale amplitude operation |
| Dimensions | Acoustic enclosure (outer): 700 mm × 800 mm × 1,248 mm; desk: 1,410 mm × 810 mm × 740 mm |
| Total Weight | 250 kg (AFM body + acoustic enclosure + active vibration isolation) |
| Required Environment | Acoustic noise level below 65 dB; floor vibration level VC-D (6.25 µm/s); power 1 kW (maximum) |
| Software | Park SmartAnalysis™ image analysis software |