Scanning Electron Microscopes (SEM)

Overview

Scanning electron microscopes (SEM) and their abundant attachments for surface observation and analysis are among the most active instruments at the R&D institutes and quality test sites in the world.

JEOL offers a wide range of lineups from general-purpose scanning electron microscopes (W-SEM), including a benchtop type that allows operations by anyone without specific knowledge and techniques, to high-end models of field emission scanning electron microscopes (FE-SEM).

In addition, energy-dispersive X-ray spectrometers (EDS) that are used for elemental analysis are also developed in-house.

Models

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  FE-SEM — Model: JSM-IT810

  Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM, featuring built-in no-coding automation for imaging and EDS analysis in a streamlined workflow.

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  SEM — Model: JSM-IT710HR

  The newly born JSM-IT710HR is the fourth-generation model of JEOL's HR series, which is based on the theme of "SEM that allows anyone to easily take high-resolution images".

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  SEM — Model: JSM-IT510

  The JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier.

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  SEM — Model: JSM-IT210

  The JSM-IT210 is JEOL's most compact stationary scanning electron microscope, with a five-axis motor-driven stage and a Simple SEM function that acquires data at the selection of a field of view.

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  Benchtop SEM — Model: JCM-7000 NeoScope™

  The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis".