Electron Probe Microanalyzer (EPMA)

It enables observation of surface tissues and morphology and local trace element analysis. Use of detectors, such as wavelength dispersive X-ray spectrometer (WDS) and soft X-ray spectrometer (SXES), can obtain more detailed measurement results than the energy-dispersive detector (EDS) used with scanning electron microscope (SEM).

JEOL — Electron Probe Microanalyzer (EPMA)

Overview

Electron Probe Microanalyzer (EPMA) has been utilized as a tool for research development and quality assurance in a variety of industrial fields such as steel, automobile, electric component, battery material and its application are expanding more and more. In addition, in academic fields, EMPA has been widely used in earth planetary science and material science.

It enables observation of surface tissues and morphology and local trace element analysis. Use of detectors, such as wavelength dispersive X-ray spectrometer (WDS) and soft X-ray spectrometer (SXES), can obtain more detailed measurement results than the energy-dispersive detector (EDS) used with scanning electron microscope (SEM).

Manufacturer: JEOL — Japan

Authorized distributor in Bangladesh. Factory-trained engineers available for local support.

Models

  • JEOL EPMA — Model: JXA-iSP100 — Electron Probe Microanalyzer (EPMA)

    EPMA — Model: JXA-iSP100

    JXA-iSP100 integrated with enhanced features, satisfies the needs of research development & quality assurance in a variety of fields and achieves efficient operations from observation to analysis.

  • JEOL FE-EPMA — Model: JXA-iHP200 — Electron Probe Microanalyzer (EPMA)

    FE-EPMA — Model: JXA-iHP200

    JXA-iHP200 equipped with field emission electron gun and integrated with enhanced features, satisfies all the needs of research development & quality assurance.

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