Particle Size Analyzers

Three complementary technologies characterize particles from nanometers to millimeters — dynamic light scattering for size and zeta potential, laser diffraction for powders and suspensions, and dynamic image analysis for particle size and shape.

Overview

Although particle systems can be complex, measuring them doesn't have to be. Anton Paar offers three technologies to characterize particles from the nanometer to the millimeter range: the Litesizer DLS series uses light scattering to determine particle size, zeta potential, and molecular mass; the Litesizer DIF laser diffraction series covers powders and suspensions; and the Litesizer DIA series adds dynamic image analysis for size and shape.

Manufacturer: Anton Paar — Austria

Local sales, installation, and technical support in Bangladesh by trained local engineers.

Models

$Anton Paar Laser Diffraction Particle Size Analyzer: Litesizer DIF — Particle Size Analyzers$
Laser Diffraction Particle Size Analyzer: Litesizer DIF
The Litesizer DIF series offers advanced particle sizing from 10 nm to 3.5 mm.
Dynamic Light Scattering Instrument: Litesizer DLS
Litesizer DLS delivers best-in-class particle sizing with automatic angle selection to prevent errors, while MAPS technology yields the highest-possible peak…
Dynamic Image Analyzer: Litesizer DIA
With Litesizer DIA Series, our dynamic image analyzer, you can easily and reliably characterize the size and shape of particles via analysis of their direct…
Automation Solution for Nanoparticle Analysis: Litesizer Cuvette Sampler
Increase DLS throughput without increasing workload: the Litesizer Cuvette Sampler automates cuvette changes for the Litesizer DLS Series and runs unattended…
Modules for Litesizer DIA and DIF: Dispersion Units
Measure various samples with a range of different dispersion units: Liquid Flow, Liquid Flow Imaging, Small Flow, Small Flow Imaging, Liquid Flow Chemical…
Automation Option for Particle Analysis: Litesizer Autosampler
The Litesizer Autosampler for the Litesizer DIF and DIA series, an automation option for particle analysis, automates the sample measurement process.