Angled SEM Mounts (30°/45°)

Angled SEM mounts are machined with the specimen table pre-tilted at a fixed 30° or 45° angle relative to the mount base, letting the operator view an inclined or vertical specimen surface face-on without physically tilting the SEM stage.

SPI Supplies Angled SEM Mounts (30°/45°) — SEM Specimen Mounts & Stubs

Manufacturer: SPI Supplies — USA

Overview

Angled SEM mounts are machined with the specimen table pre-tilted at a fixed 30° or 45° angle relative to the mount base, letting the operator view an inclined or vertical specimen surface face-on without physically tilting the SEM stage. They are turned from aluminum on a lathe and offered in the same diameter range and finishes as the standard cylindrical and pin-type mounts. A pure-carbon 30° version and a threaded, 45°-angled male version are also available for specialized stage configurations. The style was originally developed for early JEOL instruments that required a pre-angled mount to align the specimen with the electron beam.

Angle & Size Options

Mounts are available at 30° or 45° and in diameters of 9.5 mm, 15 mm, and 25.4 mm, with Lathe, Luster, or Polished surface finish. A combined threaded-male, 45°-angled mount measuring 4x30 mm is also offered for use with threaded specimen holders.

Compatibility

The 30° angled mounts are listed as compatible with older JEOL models such as the JSM-2, JSM-U3, JSM-35, and JSM Model 50A, reflecting their origin as instrument-specific accessories.

Specifications

SpecificationAngled SEM Mounts (30°/45°)
StylePre-tilted table, 30° or 45°
MaterialAluminum (also Pure Carbon, 30° 9.5 mm size)
Diameter range9.5 mm to 25.4 mm
Angle options30°, 45°
Surface finishesLathe, Luster, Polished, Standard (carbon)
Compatible SEMsJEOL JSM-2, JSM-U3, JSM-35, JSM Model 50A, and others
Special variantThreaded male, 45° angled, 4x30 mm

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