X-ray Fluorescence Spectrometers (XRF)
X-ray fluorescence spectrometry delivers fast, non-destructive elemental analysis of solids, powders, and liquids with little or no sample preparation. JEOL XRF instruments cover routine screening through precise quantitative analysis.
Overview
In XRF, the sample is excited by X-rays and each element emits its own characteristic fluorescence, allowing simultaneous identification and quantification from sodium through uranium. Because the technique is non-destructive and requires minimal preparation, it is ideal for incoming material inspection, RoHS screening, alloy verification, cement, minerals, polymers, and environmental samples. JEOL benchtop XRF analyzers make the technique fast and accessible for every laboratory.
Manufacturer: JEOL — Japan
Authorized distributor in Bangladesh. Factory-trained engineers available for local support.
Models
Energy-Dispersive XRF Spectrometer: JSX-1000S Element Eye™
Benchtop energy-dispersive XRF with touch-panel operation and Smart FP for standardless elemental analysis from Mg to U.
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