Focused Ion Beam (FIB)
A focused ion beam system is an instrument to mill a specimen using an ion beam at high speed and high precision during observation. It is possible to prepare a specimen for a transmission electron microscope (TEM) by automatic milling and 3D analysis.
A multi-beam system equipped with a scanning electron microscope (SEM) is capable of a variety of analyses by attaching a detector.
Overview
A focused ion beam system is an instrument to mill a specimen using an ion beam at high speed and high precision during observation. It is possible to prepare a specimen for a transmission electron microscope (TEM) by automatic milling and 3D analysis.
A multi-beam system equipped with a scanning electron microscope (SEM) is capable of a variety of analyses by attaching a detector.
Manufacturer: JEOL — Japan
Authorized distributor in Bangladesh. Factory-trained engineers available for local support.
Models
MultiBeam FIB-SEM — Model: JIB-PS500i
The JIB-PS500i provides three solutions to assist TEM specimen preparation. High throughput workflow is assured from specimen prepartion to TEM observation.
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