Delphi-X Observer materials science (Metallurgical) Series

Overview

State-of-the-art microscopes for advanced Materials Science applications.

The ergonomic design and outstanding state-of-the-art objectives make the Delphi-X Observer the ideal microscope for advanced Materials application. The 25 mm field of view of the eyepieces and the plan apochromatic objectives enable observations with perfect color rendering at high resolving power.

Key Highlights

• Brightfield and Darkfield illumination
• Nomarski DIC (optional)
• Infinity Optical System (IOS)
• High contrast BD objectives with minimal aberrations
• Full Apo, Semi-Apo and Plan BD objectives
• Super Wide field SWF 10x/25 mm eyepieces
• 100 W halogen illumination
• Sextuple reversed nosepiece with slot for DIC
• Many ergonomic solutions

Specifications

EYEPIECES

• Super Wide field SWF 10x/25 mm, Ø 30 mm tubes
• Extended Wide Field EWF 10x/22 mm, Ø 30 mm tubes (optional)

STANDARD HEAD

Siedentopf trinocular with 30° inclined tubes. Interpupillary distance adjustable between 47 and 78 mm. The trinocular standard head has an optical path selector (100:0 / 80:20 / 0:100). Diopter adjustment on both eyepieces.

ERGONOMIC TILTING HEAD

Optional ergonomic 0 to 35° tilting trinocular head supplied with SWF 10x/25 mm eyepieces, interpupillary distance between 47-78 mm and photo tube with standard Ø 23.2 mm tube. The trinocular tilting head has an optical path selector (100:0 / 80:20 / 0:100). Diopter ± 5 adjustments on both eyepieces.

NOSEPIECE

Revolving sextuple reversed nosepiece on ball-bearings with 26 mm objectives mounting threads.

INFINITY OPTICAL SYSTEM (IOS)

The infinity optical system (IOS) of the Delphi-X Observer™ consists of Super wide field SFWF 10x/25 mm eyepieces, high numerical aperture 45 mm parafocal objectives and a 200 mm focal length tube lens. The 200 mm focal length tube lens reduces the angle of the light rays passing through the optics and as a direct result improving significantly the chromatic aberration corrections and contrast. The objectives with larger diameter enable much higher numerical apertures improving the overall resolving power of the optical system.

For all these reasons the Delphi-X Observer™ offers superior optical performance for the most demanding applications.

STAGE

• Large 215 x 170 mm stage with 105 x 105 mm integrated right-handed mechanical stage
• Stage height can be changed to sample size or can be lowered by one inch for user ergonomics using the optional nose piece lowering attachment (DX.9887)

NOSEPIECE LOWERING ATTACHMENT

The nosepiece lowering attachment lowers the height of the revolver with 40 mm which allows the stage to be used in the 40 mm lower position as well (DX.9887).

EYE-LEVEL RISER

The eye-level riser can raise the eye-point height by 25.4 mm at one time (DX.9885).

FOCUSING

Coaxial coarse and fine adjustment, 100 graduations, 1 µm precision, 100 μm per rotation, total travel range is approximately 35 mm. Supplied with an adjustable rack stop to prevent damage to sample and objectives. The coarse adjustments are equipped with friction control. The focusing knobs can be switched from left to right according to the user's preference.

LONG W.D. CONDENSER

In height adjustable long working distance N.A. 0.65 condenser (10.2 mm) with numerical aperture identification marks allows easy setting.

ILLUMINATION

The Delphi-X Observer materials science microscope is equipped with Epi and Diascopic intensity adjustable 100 W halogen illumination with internal 100-240 Vac power supply. The diascopic halogen illumination comes with two push-in/push-out neutral density filters for attenuation of the light intensity for all kinds of samples and one Light Balancing Daylight filter (LBD).

The microscope comes standard with an analyzer and a polarizer which can easily be inserted into the free slots into the Epi-Illuminator for high quality polarized images. Further a rotating cassette is implemented for quick changing between darkfield, brightfield and dimmed brightfield.

NOMARSKI DIC (optional)

With the redesign of the DIC-module visualization of height differences which normally cannot be displayed using brightfield techniques has greatly improved. These relief like images are ideal for surface inspections of wafers, LCD screens etc.

(photo: Revolver with slot for Nomarski DIC slider).

CARRYING GRIP

The carrying grip at the back of the microscope ensures safe transportation of the microscope and the integrated tool and holder makes sure the right tool is always available.

STORAGE

AE.9914-D

OBJECTIVES

• Plan Semi-Apo (SAMi): 5x/0.15, 10x/0.30, 20x/0.45
• Plan Apo (PLAMi): 50x/0.80, 100x/0.90*
• Plan (PLMi): 2x/0.06*

PACKAGE CONTENT

Supplied with power cord, dust cover, a spare fuse, user manual and universal tool. All packed in a polystyrene box.

Delphi-X Observer materials science (metallurgical)