ICP-OES Analyzer: SPECTRO ARCOS

The top-of-the-line SPECTRO ARCOS ICP-OES excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials. New DSOI plasma viewing, CMOS detectors, and the industry’s highest-power generator take performance to a whole new level.

ICP-OES Analyzer: SPECTRO ARCOS — Inductively Coupled Plasma Optical Emission Spectrometers (ICP-OES)

Manufacturer: SPECTRO — Germany

Overview

The top-of-the-line SPECTRO ARCOS inductively coupled plasma optical emission spectrometer (ICP-OES) excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials. Extensive customer input and ongoing evolution of multiple proven technologies have inspired numerous design enhancements: a new DSOI plasma viewing option, CMOS detectors, an ultra-high-speed readout, and the industry's highest-power solid-state generator. The new SPECTRO ARCOS is available in six versions, depending on choices of plasma viewing technology and elemental wavelength range.

MultiView and DSOI: One Instrument Instead of Two

SPECTRO ARCOS is the only MultiView plasma instrument on the market, offering true axial and true radial (single or dual side-on) plasma observation in one instrument. The periscope-free MultiView mechanism lets an operator literally turn a radial-view instrument into an axial-view device, or vice versa, in 90 seconds or less. The new Dual Side-On Interface (DSOI) captures emitted light from both sides of the vertical plasma to provide twice the sensitivity of conventional radial systems, while eliminating the contamination and matrix compatibility issues that can plague vertical-torch dual-view models.

ORCA Optical System with CMOS Detectors

SPECTRO's Optimized Rowland Circle Alignment (ORCA) polychromator uses few mirrors and a direct, high-luminance light path for simultaneous spectrum capture across the 130 nm to 770 nm wavelength range, with up to 5x more sensitivity than Echelle-based systems and the industry's best transparency below 180 nm. New CMOS line-array detectors completely eliminate blooming, read trace elements' low signals even next to intense matrix lines, offer a high dynamic range, and do away with on-chip sub-zero cooling.

Speed, Power, and Stability

An extremely agile, free-running 2000 W LDMOS generator – the industry's highest power – is fully air-cooled and permits warmup in less than 10 minutes. A high-speed GigE readout enables full-spectrum transport in under 100 milliseconds, and simpler matrices can be completely analyzed in as little as 30 seconds. For transient signals from ETV or laser ablation, the system achieves 10 full-spectrum acquisitions per second. Thermally and pressure-stabilized optics and software-controlled gas flows deliver drift-free stability, even with volatile organics and high-TDS samples.

Low Operating Costs and Easy Usability

Proprietary air-cooling eliminates the expense and failure risks of an external chiller, and no-purge UV-PLUS sealed gas purification technology can save up to about $3,500 in annual gas consumables compared to constant-purge systems. A new cassette-style pump simplifies setup to 3 easy steps, an optional SPECTRO Intelligent Valve System minimizes sample-to-sample times, and an optional portable video camera allows remote monitoring of the sample introduction system, nebulizer, or plasma.

Intuitive Software with AI-Based Semiquantitative Analysis

SPECTRO ICP Analyzer Pro operating software delivers streamlined workflows, raw data processing up to 1500x faster than older models, and full audit-trail traceability. The optional SPECTRO AI QUANT module adds AI- and machine-learning-based semiquantitative analysis: with a few clicks it identifies unknown samples and approximates concentrations within minutes, with no element selection, standards preparation, or calibration required, and it operates strictly locally without any cloud connection.

Specifications for SPECTRO ARCOS

SpecificationSPECTRO ARCOS
TechniqueInductively coupled plasma optical emission spectrometry (ICP-OES)
Plasma ObservationSix versions: MultiView (true axial and true radial, single or dual side-on), DSOI (dual side-on interface), or SOP (radial single side-on), each with a choice of elemental wavelength range
MultiView ChangeoverRadial to axial view (or vice versa) in 90 seconds or less, self-aligning, with automatic software recognition of each mode
Optical SystemORCA (Optimized Rowland Circle Alignment) polychromator; direct light path; sealed, thermally and pressure-stabilized
Wavelength Range130 nm to 770 nm, simultaneous capture; industry-best transparency below 180 nm
DetectorsCMOS line-array detectors; no blooming; high dynamic range; no on-chip cooling required
GeneratorFree-running 2000 W LDMOS solid-state generator, air-cooled; warmup in less than 10 minutes
ReadoutHigh-speed GigE readout; full-spectrum transport in under 100 ms; 10 full-spectrum acquisitions per second for transient signals (ETV, laser ablation)
Analysis SpeedComplete analysis of simpler matrices in as little as 30 seconds
Gas PurificationNo-purge UV-PLUS sealed gas purification; purifying cartridge good for at least 2 years
CoolingFully air-cooled; no external chiller required
SoftwareSPECTRO ICP Analyzer Pro with audit trail; optional SPECTRO AI QUANT module for AI-based semiquantitative analysis
OptionsSPECTRO Intelligent Valve System, portable video camera kit, cassette-style peristaltic pump

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